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Launches Advanced HAST Test Socket for Semiconductor Reliability Testing

Launches Advanced HAST Test Socket for Semiconductor Reliability Testing SHENZHEN,September 15th, [Sireda Technology Co., Ltd.] a leading provider of semiconductor test solutions, today announced the launch of its newly developed HAST (Highly Accelerated Stress Test) socket, designed to meet the ...

2025-09-15

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Revolutionize Chip Testing with Our New Temperature/Thermal Cycling Workstation

Revolutionize Chip Testing with Our New Temperature/Thermal Cycling Workstation Semiconductor development teams, meet your next-generation testing solution: the Temperature/Thermal Cycling Workstation – a compact, high-speed alternative to bulky environmental chambers, designed specifically for ...

2025-09-01

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