Hot Products Top Products
More Products
About Us
China Sireda Technology Co., Ltd.
ABOUT US
Sireda Technology Co., Ltd.
Company OverviewSireda Technology Co., Ltd, established in 2010, offers semiconductor test solutions.Our Core Offeringssemiconductor device test socketAging socketburn-in socketRF test sockettest fixturetest connectorsBGA device FA supportReball serviceKey Milestones & CertificationsIn 2016, we achieved ISO9001 Certification.In 2017, we won the title of “National High-tech Enterprise".In 2021, we were awarded “Innovation & New award" by Shenzhen Semiconductor Industry Association.In 2022, we ...
Read more
Chat Now
0+
Annualsales
0
Year
0%
P.C
0+
Employees
WE PROVIDE
THE BEST SERVICE!
You can contact us in various ways
Chat Now
Tel
86-0755-23036306
Sireda Technology Co., Ltd.

Quality IC Test Sockets & Test Connector Factory

Events
Lastest company news about
"Building Dreams Together · Creating the Future" – SIREDA 2026 Annual Gala Concludes Successfully

2026-02-05

.gtr-container-gala-x7y9z2 { font-family: Verdana, Helvetica, "Times New Roman", Arial, sans-serif; color: #333; line-height: 1.6; padding: 16px; box-sizing: border-box; max-width: 100%; overflow-x: hidden; } .gtr-container-gala-x7y9z2 p { font-size: 14px; margin-bottom: 1em; text-align: left !important; } .gtr-container-gala-x7y9z2 strong { font-weight: bold; } .gtr-container-gala-x7y9z2 .gtr-section-heading { font-size: 18px; font-weight: bold; margin-top: 2em; margin-bottom: 1em; color: #0056b3; /* A subtle industrial blue for headings */ text-align: left !important; } .gtr-container-gala-x7y9z2 .gtr-quote { font-style: italic; margin: 1.5em 0; padding: 1em 1.5em; border-left: 4px solid #007bff; /* Accent border for quotes */ background-color: #f8f9fa; /* Light background for quotes */ color: #555; text-align: left !important; } .gtr-container-gala-x7y9z2 .gtr-quote p { margin-bottom: 0; } .gtr-container-gala-x7y9z2 ul { list-style: none !important; padding-left: 20px !important; margin-bottom: 1em; } .gtr-container-gala-x7y9z2 ul li { position: relative !important; padding-left: 20px !important; margin-bottom: 0.5em !important; font-size: 14px !important; text-align: left !important; list-style: none !important; } .gtr-container-gala-x7y9z2 ul li::before { content: "•" !important; position: absolute !important; left: 0 !important; color: #007bff !important; /* Blue bullet points */ font-size: 1.2em !important; line-height: 1 !important; } .gtr-container-gala-x7y9z2 .gtr-credits { font-size: 12px; color: #777; margin-top: 2em; text-align: right !important; } /* Image handling: No specific layout or dimension styles for images or their parents */ /* Images will render at their intrinsic size or specified width/height attributes */ /* This means images wider than the container will cause horizontal scroll */ @media (min-width: 768px) { .gtr-container-gala-x7y9z2 { padding: 24px 40px; max-width: 960px; /* Constrain content width on larger screens */ margin: 0 auto; /* Center the component */ } .gtr-container-gala-x7y9z2 .gtr-section-heading { font-size: 20px; } .gtr-container-gala-x7y9z2 p { font-size: 15px; } .gtr-container-gala-x7y9z2 ul li { font-size: 15px !important; } } [SIREDA, January 30, 2026] – On January 30, 2026, all members of SIREDA gathered at [Haoguangming Grand Restaurant] for the grand "Building Dreams Together · Creating the Future" themed annual gala. The event celebrated the remarkable achievements of 2025 and looked forward to new milestones in 2026. Activities included year-end summaries, awards ceremonies, spectacular performances, and exciting lucky draws, creating an enthusiastic atmosphere that fully showcased SIREDA’s team spirit and cohesion. Year in Review & Future Outlook The gala commenced with an opening speech by SIREDA CEO [Frank], who summarized the company’s developmental milestones in 2025 and outlined strategic goals for 2026. He emphasized: "In 2025, we achieved breakthrough progress in technological innovation, market expansion, and customer service. In 2026, we will continue to uphold our corporate philosophy of 'Innovation · Win-Win Cooperation' and strive for greater success together!" Honoring Excellence One of the highlights was the Annual Employee and Team Awards Ceremony. This year’s awards included: "Outstanding Employee" "Best Newcomer" "Most Improved Employee" A total of 25 employees were honored, receiving enthusiastic applause as their contributions were celebrated. Spectacular Performances The gala wasn’t just about recognition—it was also a showcase of SIREDA talents! Various departments prepared entertaining performances: Opening Dance: "Glory Days" (Cross-department collaboration: Technology + Production + Procurement) Creative Poetry Recital: "I Love Working" (CNC Team) Fireworks Display (Assembly Team) The audience burst into laughter and applause, fully immersed in the festive atmosphere. Exciting Lucky Draws & Prizes The most anticipated segment was the "Super Lucky Draw", featuring three rounds with incredible prizes: Huawei Mate80 Cash prizes (¥3000 & ¥1000) Electric Scooter Xiaomi Toothbrush Set The ultimate winner was [Hu Lin from CNC Department], who took home the grand prize, earning the title of "Luckiest Worker!" Celebration & Toast The evening continued with a warm banquet, where employees gathered for fine dining, mingling, and laughter. SIREDA’s CEO Frank delivered a toast: "Thank you to every SIREDA team member for your dedication. Let’s move forward together and embrace new challenges in the coming year!" Looking Ahead to 2026 The gala concluded with a choir performance of "Tomorrow Will Be Better", symbolizing SIREDA’s cohesive culture and team spirit. Moving forward, all SIREDA members will uphold the core values of "Innovation, Collaboration, Excellence" and tackle new opportunities in 2026 with renewed passion! (Contributed by SIREDA Branding Dept. | Photography: Team SIREDA)
View More
Lastest company news about Launches Advanced HAST Test Socket for Semiconductor Reliability Testing
Launches Advanced HAST Test Socket for Semiconductor Reliability Testing

2025-09-15

.gtr-container-xyz789 { font-family: Verdana, Helvetica, "Times New Roman", Arial, sans-serif; color: #333; line-height: 1.6; padding: 15px; box-sizing: border-box; max-width: 100%; overflow-x: hidden; } .gtr-container-xyz789 p { font-size: 14px; margin-bottom: 1em; text-align: left; color: #444; } .gtr-container-xyz789 strong { font-weight: bold; color: #222; } .gtr-container-xyz789 em { font-style: italic; color: #555; } .gtr-container-xyz789 .gtr-title { font-size: 18px; font-weight: bold; margin-bottom: 1.5em; color: #0056b3; /* A strong blue for industrial feel */ text-align: left; } .gtr-container-xyz789 .gtr-section-heading { font-size: 16px; font-weight: bold; margin-top: 2em; margin-bottom: 1em; color: #0056b3; text-align: left; } .gtr-container-xyz789 ul { list-style: none !important; margin: 0 !important; padding: 0 !important; margin-bottom: 1em !important; } .gtr-container-xyz789 ul li { position: relative; padding-left: 25px; margin-bottom: 0.5em; font-size: 14px; text-align: left; color: #444; } .gtr-container-xyz789 ul li::before { content: "•"; /* Custom bullet point */ position: absolute; left: 0; top: 0; color: #0056b3; /* Blue bullet */ font-size: 1.2em; line-height: inherit; } .gtr-container-xyz789 a { color: #007bff; text-decoration: none; } .gtr-container-xyz789 a:hover { text-decoration: underline; } @media (min-width: 768px) { .gtr-container-xyz789 { padding: 25px; max-width: 800px; /* Constrain width for better readability on large screens */ margin: 0 auto; /* Center the component */ } .gtr-container-xyz789 .gtr-title { font-size: 22px; } .gtr-container-xyz789 .gtr-section-heading { font-size: 18px; } } Launches Advanced HAST Test Socket for Semiconductor Reliability Testing SHENZHEN,September 15th, [Sireda Technology Co., Ltd.] a leading provider of semiconductor test solutions, today announced the launch of its newly developed HAST (Highly Accelerated Stress Test) socket, designed to meet the demanding requirements of modern reliability testing for integrated circuits. The new HAST test socket is engineered to perform under extreme environmental stress conditions, enabling customers to accelerate device qualification and reliability verification. Specifically, it supports testing at 130°C, 85% relative humidity (RH), and under pressurized environments (typically 2.3 atm) for extended durations ranging from 96 to 168 hours. This capability allows semiconductor manufacturers and research institutions to evaluate product durability and ensure compliance with industry standards for high-reliability applications, including automotive, aerospace, and industrial electronics. "As devices continue to shrink in size while expanding in functionality, ensuring long-term reliability is more critical than ever," said [Executive Name], [Title] at [Company Name]. "Our HAST test socket delivers the stability, precision, and repeatability required for rigorous stress testing, helping customers shorten time-to-market while maintaining product integrity." Key benefits of the HAST test socket include: High-temperature and high-humidity endurance. Secure and stable contact performance under pressurized conditions. Compatibility with extended test durations (96–168 hours). Scalable design adaptable to various package types. With this launch, Sireda continues to strengthen its position as an innovator in semiconductor testing solutions, addressing the increasing demand for reliability validation in advanced electronics. For more information about the HAST test socket and other semiconductor test solutions, please visit www.sireda.com .
View More
Lastest company news about Revolutionize Chip Testing with Our New Temperature/Thermal Cycling Workstation
Revolutionize Chip Testing with Our New Temperature/Thermal Cycling Workstation

2025-09-01

.gtr-container-abc987 { font-family: Verdana, Helvetica, "Times New Roman", Arial, sans-serif; color: #333; line-height: 1.6; max-width: 800px; margin: 0 auto; padding: 20px; box-sizing: border-box; } .gtr-container-abc987 .gtr-title-main { font-size: 18px; font-weight: bold; margin-bottom: 1em; text-align: left; color: #0056b3; } .gtr-container-abc987 .gtr-title-section { font-size: 16px; font-weight: bold; margin-top: 1.5em; margin-bottom: 1em; text-align: left; color: #0056b3; border-bottom: 1px solid #eee; padding-bottom: 5px; } .gtr-container-abc987 p { font-size: 14px; margin: 1em 0; text-align: left; word-break: normal; overflow-wrap: normal; } .gtr-container-abc987 strong { font-weight: bold; } .gtr-container-abc987 em { font-style: italic; } .gtr-container-abc987 ul { list-style: none !important; margin: 1em 0 !important; padding: 0 !important; } .gtr-container-abc987 ul li { position: relative; padding-left: 25px; margin-bottom: 0.5em; font-size: 14px; text-align: left; } .gtr-container-abc987 ul.gtr-list-checkmark li::before { content: '✓'; position: absolute; left: 0; top: 0; color: #28a745; font-weight: bold; font-size: 16px; line-height: 1.6; } .gtr-container-abc987 ul:not(.gtr-list-checkmark) li::before { content: '•'; position: absolute; left: 0; top: 0; color: #0056b3; font-weight: bold; font-size: 16px; line-height: 1.6; } .gtr-container-abc987 img { max-width: 100%; height: auto; display: block; margin: 1em auto; } @media (min-width: 768px) { .gtr-container-abc987 { padding: 30px; } .gtr-container-abc987 .gtr-title-main { font-size: 22px; margin-bottom: 1.5em; } .gtr-container-abc987 .gtr-title-section { font-size: 18px; margin-top: 2em; margin-bottom: 1.2em; } } Revolutionize Chip Testing with Our New Temperature/Thermal Cycling Workstation Semiconductor development teams, meet your next-generation testing solution: the Temperature/Thermal Cycling Workstation – a compact, high-speed alternative to bulky environmental chambers, designed specifically for efficient chip verification. Why Settle for Slow, Inefficient Testing? Traditional thermal chambers force engineers to test entire PCBs at industrial temperature ranges (-55°C to 150°C), wasting time and energy cooling/heating non-critical components. Our Targeted Thermal Cycling Workstation changes the game by applying extreme temperatures only to the chip under test (DUT)—accelerating R&D while cutting costs. Key Advantages Over Standard Chambers Precision Thermal Stress Only Where You Need It Operates at -55°C to +150°C but only conditions the DUT—not the whole PCB. Eliminates unnecessary thermal cycling of connectors, passives, and support circuitry. Blazing-Fast Thermal Ramp Rates 3–5x faster than conventional chambers (active gas thermal transfer ensures rapid stabilization). No frost buildup—dry-air technology prevents condensation, enabling continuous testing. Space-Saving & Lab-Friendly Fits on a standard desk—no need for dedicated chamber rooms. Instant setup for on-demand chip-level qualification. Who Benefits? IC Designers: Verify reliability without waiting for full PCB thermal stabilization. Validation Teams: Perform stress tests in hours, not days. Startups & Academia: Affordable, benchtop-sized alternative to industrial chambers. Technical Highlights: Temperature Range: -55°C to +150°C Ramp Rate: ±30°C/min (adjustable) Control: PC programmable via LabVIEW/API Footprint: 30cm x 25cm (fits in tight lab spaces) Cut Development Time & Costs Today Stop wasting energy and time on full-board environmental testing. Focus on the chip—not the chamber.
View More
Latest company case about High-Temperature Chamber for Memory Module Burn-In
High-Temperature Chamber for Memory Module Burn-In

2025-09-15

.gtr-container-x7y2z9 { font-family: Verdana, Helvetica, "Times New Roman", Arial, sans-serif; color: #333; line-height: 1.6; padding: 15px; max-width: 100%; box-sizing: border-box; border: none; } .gtr-container-x7y2z9 .gtr-section-title { font-size: 18px; font-weight: bold; color: #0056b3; margin-top: 25px; margin-bottom: 15px; text-align: left; } .gtr-container-x7y2z9 p { font-size: 14px; margin-bottom: 15px; text-align: left !important; word-break: normal; overflow-wrap: normal; } .gtr-container-x7y2z9 strong { color: #0056b3; } .gtr-container-x7y2z9 ul { list-style: none !important; margin: 0 !important; padding: 0 !important; margin-bottom: 15px; } .gtr-container-x7y2z9 ul li { position: relative; padding-left: 25px; margin-bottom: 10px; font-size: 14px; text-align: left; } .gtr-container-x7y2z9 ul li::before { content: "•"; position: absolute; left: 0; top: 0; color: #0056b3; font-size: 16px; line-height: 1.6; } @media (min-width: 768px) { .gtr-container-x7y2z9 { padding: 25px 50px; max-width: 960px; margin: 0 auto; } .gtr-container-x7y2z9 .gtr-section-title { font-size: 20px; margin-top: 35px; margin-bottom: 20px; } .gtr-container-x7y2z9 p { margin-bottom: 20px; } .gtr-container-x7y2z9 ul li { margin-bottom: 12px; } } As memory modules are widely used in servers, data centers, and industrial systems, ensuring their long-term reliability under elevated temperature conditions is critical. Traditional full-chamber ovens can be costly, space-consuming, and inefficient when only localized thermal stress is required. To address this challenge, SIREDA developed a custom high-temperature chamber (thermal hood) designed specifically for localized burn-in testing of memory modules. The customer needed a solution that could: Provide a localized high-temperature environment for memory modules during burn-in. Operate within a temperature range of room temperature to 85°C. Be controlled remotely and automatically via host PC software. Deliver stable and uniform thermal conditions without affecting surrounding components. Sireda designed and manufactured a high-temperature chamber (thermal hood) that directly encloses the memory module area, creating a controlled micro-environment for burn-in testing. The chamber integrates precision heating elements and sensors to maintain accurate temperature levels. The system is fully integrated with host PC software, allowing operators to program temperature profiles, automate test cycles, and monitor test data in real time. This ensures both consistency and efficiency in the burn-in process. Results & Benefits Controlled Test Environment: Stable and repeatable temperature conditions up to 85°C. Localized Heating: Reduced energy consumption compared to full-size ovens. Automation: Host PC control enables unattended operation and higher throughput. Improved Reliability Testing: Enhanced ability to identify early-life failures and validate product durability. Conclusion Through the development of the high-temperature chamber, [Company Name] provided the customer with a cost-effective and efficient tool for memory module burn-in and reliability testing. This case highlights our ability to deliver customized, application-specific test solutions that support customers in meeting their product quality goals.
View More

Sireda Technology Co., Ltd.
MARKET DISTRIBUTION
map 30% 40% 22% 8%
map
WHAT CUSTOMERS SAYS
Rayson
Your team’s innovative approach to designing multi-layer test racks has been transformative for our operations. By optimizing space and enabling seated testing—previously only possible while standing—you’ve significantly improved our workflow efficiency. A brilliant solution!
Longsys
Compared to our previous supplier's test fixtures, yours deliver longer lifespans and far more stable performance. This reliability has significantly reduced our maintenance costs and improved testing efficiency.
CXMT
Your team’s service has been exceptional—responsive, professional, and detail-oriented. Despite tight deadlines, you delivered the test fixtures ahead of schedule without compromising quality. This reliability has made you a trusted long-term partner for our production needs.
CONTACT US AT ANY TIME!