Launches Advanced HAST Test Socket for Semiconductor Reliability Testing

Launches Advanced HAST Test Socket for Semiconductor Reliability Testing

SHENZHEN,September 15th, [Sireda Technology Co., Ltd.] a leading provider of semiconductor test solutions, today announced the launch of its newly developed HAST (Highly Accelerated Stress Test) socket, designed to meet the demanding requirements of modern reliability testing for integrated circuits.

The new HAST test socket is engineered to perform under extreme environmental stress conditions, enabling customers to accelerate device qualification and reliability verification. Specifically, it supports testing at 130°C, 85% relative humidity (RH), and under pressurized environments (typically 2.3 atm) for extended durations ranging from 96 to 168 hours.

This capability allows semiconductor manufacturers and research institutions to evaluate product durability and ensure compliance with industry standards for high-reliability applications, including automotive, aerospace, and industrial electronics.

"As devices continue to shrink in size while expanding in functionality, ensuring long-term reliability is more critical than ever," said [Executive Name], [Title] at [Company Name]. "Our HAST test socket delivers the stability, precision, and repeatability required for rigorous stress testing, helping customers shorten time-to-market while maintaining product integrity."

Key benefits of the HAST test socket include:

• High-temperature and high-humidity endurance.
• Secure and stable contact performance under pressurized conditions.
• Compatibility with extended test durations (96–168 hours).
• Scalable design adaptable to various package types.

With this launch, Sireda continues to strengthen its position as an innovator in semiconductor testing solutions, addressing the increasing demand for reliability validation in advanced electronics.

For more information about the HAST test socket and other semiconductor test solutions, please visit www.sireda.com .