Products
PRODUCTS DETAILS
Home > Products >
Non Destructive BGA Test Socket 25GHz High Speed Test Socket Quick Swap Design

Non Destructive BGA Test Socket 25GHz High Speed Test Socket Quick Swap Design

MOQ: 1
Price: Get Quote
Detail Information
Place of Origin
China
Brand Name
Sireda
Certification
ISO9001
Model Number
Open Top
Pitch:
≥0.3mm
Bandwidth:
80G
Pin Count:
2-2000+
Compatible Packages::
BGA, QFN, LGA, SOP, WLCSP
Socket Type:
Open Top
Conductor Type:
Probe Pins, Pogo Pin, PCR
Highlight:

BGA Test Socket 25GHz

,

Non Destructive BGA Test Socket

,

25GHz High Speed Test Socket

Product Description

Non-Destructive BGA Test Sockets | 25GHz High-Speed & Quick-Swap Design

Non Destructive BGA Test Socket 25GHz High Speed Test Socket Quick Swap Design 0Hybrid Elastomer Matrix 

Self-healing conductive layers maintain stable contact through thermal cycling (-40°C to +125°C)

 

Tool-Free Maintenance 

 Modular design enables full contact grid replacement in under 2 minutes

 

Universal Compatibility 

Adaptable for BGA, QFN, CSP, and PoP test sockets (custom configurations available)

 

Zero Ball Damage 

Compression force controlled within 20-25g/ball (vs. 30g+ industry standard)

 

 

Custom Elastomer Test Socket

Property

Parameter

Typical Value

Mechanical

Insertion Cycles

≥30K–50K cycles

 

Contact Force

15~25g/pin

 

Operating Temperature

Commercial -40 ~ +125
Military -55 ~ +130

 

Tolerance

±0.01mm

Electrical

Contact Resistance

<50mΩ

 

Impedance

50Ω (±5%)

 

Current

1.5A~3A

 

 

Why Choose Our Rubber Test Sockets?

Our elastomeric test sockets offer the perfect balance of performance, durability, and ease of use, ensuring accurate testing while protecting your ICs. Whether you need high-frequency testing for 5G/RF applications, ultra-fine pitch probing, or long-term burn-in reliability, our gentle-contact, low-maintenance design reduces costs and extends the life of your test setup.

No damage to solder balls or pads – Precision force distribution protects your ICs
Long-lasting – 100K+ test cycles with minimal performance degradation
Easy maintenance – Swap contact pins in minutes, no special tools required
High-frequency capable – Reliable signal integrity up to 25GHz
Universal compatibility – Works with BGA, QFN, CSP, PoP & more

Need a custom solution? Contact us today to discuss your IC testing needs—we specialize in bespoke test socket designs for advanced semiconductor applications.