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High Cycle ATE IC Test Sockets Long Lasting Performance For Demanding Production Tests
| MOQ: | 1 |
| Price: | Get Quote |
ATE IC Test Sockets
,High Cycle IC Test Sockets
,ATE testing socket
Our ATE IC Sockets are precision-engineered for high-speed memory testing, including DDR5 and LPDDR5 ICs, ensuring signal integrity at multi-GHz speeds. Built for automated test equipment (ATE), these rugged sockets deliver ultra-low skew, minimal crosstalk, and stable impedance --critical for data centers, AI accelerators, and next-gen memory validation.
- Superior Durability - Built for high-cycle testing with robust materials that withstand thousands of insertions
- Broad Compatibility - Supports BGA, QFN, SOP, and other IC packages
- Precision Contact Technology - Low-resistance spring probes or pogo pins for reliable electrical connections
- Custom Configurations - Tailored test fixtures for unique IC designs and testing requirements
- Thermal & High-Frequency Options - Specialized sockets for burn-in, high-temp, and RF testing
For more options or custom requests, see the details below or get in touch with our engineers.
| Property | Parameter | Typical Value |
|---|---|---|
| Mechanical | Insertion Cycles | ≥30K-50K cycles |
| Contact Force | 20-30g/pin | |
| Operating Temperature | Commercial -40 ~ +125 Military -55 ~ +130 |
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| Tolerance | ±0.01mm | |
| Electrical | Contact Resistance | <50mΩ |
| Impedance | 50Ω (±5%) | |
| Current | 1.5A~3A |
Whether you're validating prototypes, programming ICs, or running high-volume production tests, our custom test sockets ensure accuracy and repeatability. Engineered for challenging environments, our sockets feature robust mechanical designs to prevent warping under thermal stress while maintaining stable contact resistance. Compatible with automated handlers and testers, they streamline your validation process while cutting downtime.
