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Open Top Programming IC Test Sockets High Temperature For Semiconductor Testing
| MOQ: | 1 |
| Price: | Get Quote |
Open Top IC Test Sockets
,Programming IC Test Sockets
,High Temperature semiconductor test socket
Premium Open Top Burn-In & Programming Test Socket for Demanding Semiconductor Testing
Designed for reliability in high-temperature environments (up to 130°C+), our burn-in test sockets ensure consistent performance during extended IC programming and testing cycles. Featuring:
- Customizable configurations to match your specific IC package (BGA, QFN, CSP, etc.)
- Robust construction for repeated insertions/extractions without wear
- Optimized for automated test equipment (ATE) integration
Ideal for semiconductor manufacturers, testing labs, and R&D facilities requiring precision and longevity.
Below are the essential specifications engineers evaluate when selecting test sockets for maximum reliability and throughput:
Custom Open-Top IC Test Socket: Core Specifications
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Property |
Parameter |
Typical Value |
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Mechanical |
Insertion Cycles |
≥30K–50K cycles |
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Contact Force |
20–30g/pin |
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Operating Temperature |
Commercial -40 ~ +125 |
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Tolerance |
±0.01mm |
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Electrical |
Contact Resistance |
<50mΩ |
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Impedance |
50Ω (±5%) |
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Current |
1.5A~3A |
Your Trusted Partner for Precision IC Test Socket Solutions
At Sireda, we deliver end-to-end test socket solutions—from high-volume standard models to fully bespoke configurations engineered for your exact requirements.
Standard Solutions Ready for Immediate Deployment:
✔ Fine-Pitch BGA Sockets (0.3mm–1.5mm pitch options)
✔ Low-Profile QFN/LGA Sockets with zero-insertion-force (ZIF) actuation
✔ High-Speed/RF Sockets (DC to 70GHz with minimal signal loss)
✔ Mission-Critical Sockets for burn-in, automotive, and MIL-STD environments
Let’s engineer the optimal interface between your IC and test equipment—contact our team today for a no-obligation project review.
