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China Sireda Technology Co., Ltd.
About Us
Sireda Technology Co., Ltd.
Company OverviewSireda Technology Co., Ltd, established in 2010, offers semiconductor test solutions.Our Core Offeringssemiconductor device test socketAging socketburn-in socketRF test sockettest fixturetest connectorsBGA device FA supportReball serviceKey Milestones & CertificationsIn 2016, we achieved ISO9001 Certification.In 2017, we won the title of “National High-tech Enterprise".In 2021, we were awarded “Innovation & New award" by Shenzhen Semiconductor Industry Association.In 2022, we ...
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Sireda Technology Co., Ltd.

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Lastest company news about Launches Advanced HAST Test Socket for Semiconductor Reliability Testing
Launches Advanced HAST Test Socket for Semiconductor Reliability Testing

2025-09-15

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Lastest company news about Revolutionize Chip Testing with Our New Temperature/Thermal Cycling Workstation
Revolutionize Chip Testing with Our New Temperature/Thermal Cycling Workstation

2025-09-01

.gtr-container-abc987 { font-family: Verdana, Helvetica, "Times New Roman", Arial, sans-serif; color: #333; line-height: 1.6; max-width: 800px; margin: 0 auto; padding: 20px; box-sizing: border-box; } .gtr-container-abc987 .gtr-title-main { font-size: 18px; font-weight: bold; margin-bottom: 1em; text-align: left; color: #0056b3; } .gtr-container-abc987 .gtr-title-section { font-size: 16px; font-weight: bold; margin-top: 1.5em; margin-bottom: 1em; text-align: left; color: #0056b3; border-bottom: 1px solid #eee; padding-bottom: 5px; } .gtr-container-abc987 p { font-size: 14px; margin: 1em 0; text-align: left; word-break: normal; overflow-wrap: normal; } .gtr-container-abc987 strong { font-weight: bold; } .gtr-container-abc987 em { font-style: italic; } .gtr-container-abc987 ul { list-style: none !important; margin: 1em 0 !important; padding: 0 !important; } .gtr-container-abc987 ul li { position: relative; padding-left: 25px; margin-bottom: 0.5em; font-size: 14px; text-align: left; } .gtr-container-abc987 ul.gtr-list-checkmark li::before { content: '✓'; position: absolute; left: 0; top: 0; color: #28a745; font-weight: bold; font-size: 16px; line-height: 1.6; } .gtr-container-abc987 ul:not(.gtr-list-checkmark) li::before { content: '•'; position: absolute; left: 0; top: 0; color: #0056b3; font-weight: bold; font-size: 16px; line-height: 1.6; } .gtr-container-abc987 img { max-width: 100%; height: auto; display: block; margin: 1em auto; } @media (min-width: 768px) { .gtr-container-abc987 { padding: 30px; } .gtr-container-abc987 .gtr-title-main { font-size: 22px; margin-bottom: 1.5em; } .gtr-container-abc987 .gtr-title-section { font-size: 18px; margin-top: 2em; margin-bottom: 1.2em; } } Revolutionize Chip Testing with Our New Temperature/Thermal Cycling Workstation Semiconductor development teams, meet your next-generation testing solution: the Temperature/Thermal Cycling Workstation – a compact, high-speed alternative to bulky environmental chambers, designed specifically for efficient chip verification. Why Settle for Slow, Inefficient Testing? Traditional thermal chambers force engineers to test entire PCBs at industrial temperature ranges (-55°C to 150°C), wasting time and energy cooling/heating non-critical components. Our Targeted Thermal Cycling Workstation changes the game by applying extreme temperatures only to the chip under test (DUT)—accelerating R&D while cutting costs. Key Advantages Over Standard Chambers Precision Thermal Stress Only Where You Need It Operates at -55°C to +150°C but only conditions the DUT—not the whole PCB. Eliminates unnecessary thermal cycling of connectors, passives, and support circuitry. Blazing-Fast Thermal Ramp Rates 3–5x faster than conventional chambers (active gas thermal transfer ensures rapid stabilization). No frost buildup—dry-air technology prevents condensation, enabling continuous testing. Space-Saving & Lab-Friendly Fits on a standard desk—no need for dedicated chamber rooms. Instant setup for on-demand chip-level qualification. Who Benefits? IC Designers: Verify reliability without waiting for full PCB thermal stabilization. Validation Teams: Perform stress tests in hours, not days. Startups & Academia: Affordable, benchtop-sized alternative to industrial chambers. Technical Highlights: Temperature Range: -55°C to +150°C Ramp Rate: ±30°C/min (adjustable) Control: PC programmable via LabVIEW/API Footprint: 30cm x 25cm (fits in tight lab spaces) Cut Development Time & Costs Today Stop wasting energy and time on full-board environmental testing. Focus on the chip—not the chamber.
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Latest company case about High-Temperature Chamber for Memory Module Burn-In
High-Temperature Chamber for Memory Module Burn-In

2025-09-15

.gtr-container-x7y2z9 { font-family: Verdana, Helvetica, "Times New Roman", Arial, sans-serif; color: #333; line-height: 1.6; padding: 15px; max-width: 100%; box-sizing: border-box; border: none; } .gtr-container-x7y2z9 .gtr-section-title { font-size: 18px; font-weight: bold; color: #0056b3; margin-top: 25px; margin-bottom: 15px; text-align: left; } .gtr-container-x7y2z9 p { font-size: 14px; margin-bottom: 15px; text-align: left !important; word-break: normal; overflow-wrap: normal; } .gtr-container-x7y2z9 strong { color: #0056b3; } .gtr-container-x7y2z9 ul { list-style: none !important; margin: 0 !important; padding: 0 !important; margin-bottom: 15px; } .gtr-container-x7y2z9 ul li { position: relative; padding-left: 25px; margin-bottom: 10px; font-size: 14px; text-align: left; } .gtr-container-x7y2z9 ul li::before { content: "•"; position: absolute; left: 0; top: 0; color: #0056b3; font-size: 16px; line-height: 1.6; } @media (min-width: 768px) { .gtr-container-x7y2z9 { padding: 25px 50px; max-width: 960px; margin: 0 auto; } .gtr-container-x7y2z9 .gtr-section-title { font-size: 20px; margin-top: 35px; margin-bottom: 20px; } .gtr-container-x7y2z9 p { margin-bottom: 20px; } .gtr-container-x7y2z9 ul li { margin-bottom: 12px; } } As memory modules are widely used in servers, data centers, and industrial systems, ensuring their long-term reliability under elevated temperature conditions is critical. Traditional full-chamber ovens can be costly, space-consuming, and inefficient when only localized thermal stress is required. To address this challenge, SIREDA developed a custom high-temperature chamber (thermal hood) designed specifically for localized burn-in testing of memory modules. The customer needed a solution that could: Provide a localized high-temperature environment for memory modules during burn-in. Operate within a temperature range of room temperature to 85°C. Be controlled remotely and automatically via host PC software. Deliver stable and uniform thermal conditions without affecting surrounding components. Sireda designed and manufactured a high-temperature chamber (thermal hood) that directly encloses the memory module area, creating a controlled micro-environment for burn-in testing. The chamber integrates precision heating elements and sensors to maintain accurate temperature levels. The system is fully integrated with host PC software, allowing operators to program temperature profiles, automate test cycles, and monitor test data in real time. This ensures both consistency and efficiency in the burn-in process. Results & Benefits Controlled Test Environment: Stable and repeatable temperature conditions up to 85°C. Localized Heating: Reduced energy consumption compared to full-size ovens. Automation: Host PC control enables unattended operation and higher throughput. Improved Reliability Testing: Enhanced ability to identify early-life failures and validate product durability. Conclusion Through the development of the high-temperature chamber, [Company Name] provided the customer with a cost-effective and efficient tool for memory module burn-in and reliability testing. This case highlights our ability to deliver customized, application-specific test solutions that support customers in meeting their product quality goals.
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Sireda Technology Co., Ltd.
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WHAT CUSTOMERS SAYS
Rayson
Your team’s innovative approach to designing multi-layer test racks has been transformative for our operations. By optimizing space and enabling seated testing—previously only possible while standing—you’ve significantly improved our workflow efficiency. A brilliant solution!
Longsys
Compared to our previous supplier's test fixtures, yours deliver longer lifespans and far more stable performance. This reliability has significantly reduced our maintenance costs and improved testing efficiency.
CXMT
Your team’s service has been exceptional—responsive, professional, and detail-oriented. Despite tight deadlines, you delivered the test fixtures ahead of schedule without compromising quality. This reliability has made you a trusted long-term partner for our production needs.
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